| Analytical electron microscopy | |
| Secretariat: | JISC |
| Secretary: | Dr Kazutoshi Kaji |
| Chair: | Dr Shigeharu Hinotani (Japan) |
| Number of published ISO standards under the direct responsibility of the TC 202/SC 3 Secretariat: | none |
| Participating countries: | 9 |
| Observer countries: | 6 |
| ISO
technical programme: (drafts and new work items under the direct responsibility of TC 202/SC 3) |
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| Business plan ( PDF 290 KB ) | |
| Working area on ISOTC | |
| Standards/projects | ||
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ISO/DIS 22493 | Microbeam analysis -- Scanning electron microscopy -- Vocabulary |
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ISO 23833:2006 | Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary |
| Standards/projects | ||
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ISO 14594:2003 | Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
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ISO 14595:2003 | Microbeam analysis -- Electron probe microanalysis -- Guidelines for the specification of certified reference materials (CRMs) |
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ISO 14595:2003/Cor 1:2005 | |
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ISO 16592:2006 | Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method |
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ISO 17470:2004 | Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry |
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ISO 22489:2006 | Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy |
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| Standards/projects | ||
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ISO 16700:2004 | Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification |
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ISO/CD 24597 | Microbeam analysis -- Scanning electron microscopy -- Measurement methods of image resolution |
http://www.microscopy-analysis.com/cgi-bin/item.cgi?ap=1&id=459
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